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Human Performance Lab

 

Lab 

The University of Dallas Human Performance Laboratory is a multifunctional facility. Equipment is state-of-the-art and allows students and faculty to perform research and investigate techniques used in biomechanics, exercise science, and performance training.

Areas of interest include human motion analysis using kinematic/dynamic studies. Balance, movement, and gait assessment in elderly for fall prevention are focused areas of research.

Our video motion analysis and intertial measurement units allow for the collection of quantifiable data on position in plane, position vs. time, angular velocity & acceleration, angle, rotation (6DOF), acceleration, average, median & FIR filters, stick figure plot, and spline interpolation. This coupled with electromyography and work physiology provide a robust performance profile.

Equipment:
 

Memsense Wireless Inertial Measurement Units (IMU)

Shimmer Research wireless EMG

iWorx Metabolic Cart

RJL Systems Bio-impedance Analyzer

Lange Skinfold Calipers/Reflective Pulse Oximetry

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iWorx 214 A/D - ECG/Polar H.R. Monitors

Lactate Scout meters

iWorx Pulmonary Function Tests

Innovision Systems 2D/3D Motion Analysis

GLI Interactive 3-DOF Inertial Measurement Units

High-speed cameras

ProForm Perspective ES Treadmill

LeMond G-Force UT Cycle Ergometer

Chatillon Medical Dynamometer

vo2max


 
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Analysis:
  

Gait/Motion Analysis using IMUs and video motion analysis

Realtime O2/CO2  - VO2max

Lactate Threshold/Glucose Levels

BMI/FFM/TBW Determination

Range of Motion Studies for Baseline and Dysfunction

Lung Function/Spirometry

Electromyography (EMG)

Grip Strength / Reaction Time

 
 
Contact:

For information on service work, testing, and athletic performance profiles, contact Dr. Stephen Slaughter stephens@udallas.edu.    Researcher Associate: Dr. Lonn Hutcheson.

 

Professional Memberships

American College of Sports Medicine (ACSM)

Institute of Electrical and Electronics Engineers (IEEE)

Recent Publications/Presentations:

Stephen Slaughter, Patrick Butler, Heather Capozzella, Amanda Nguyen, Lonn Hutcheson, The Comparative Gait Effects of Select Walking Surfaces using Kinetic and EMG Analyses, Human Movement Journal, 2012, vol. 13(3).

Stephen Slaughter, Rachel Hales, Cheryl Hinze, Catherine Pfeiffer, Quantifying Stability Using Frequency Domain Data from Wireless Inertial Measurement Units, Journal of Systemics, Cybernetics, and Informatics, 2012, 10(4) 

Stephen Slaughter, Caroline Hilbert, Noah Jouett, Maureen McEwen, Characterization of Gait Using Inertial Measurement Units and Neural Networks, Presented at the SCASB 2010 conference at TWU, Feb. 12, 2010

Stephen Slaughter, Caroline Hilbert, Noah Jouett, Maureen McEwen, A mechanism to PredictLimits of Stability in Human Subjects, Medicine and Science in Sports and Exercise 2010, Vol. 42:5 Supplement

Stephen Slaughter, Caroline Hilbert, Noah Jouett, Maureen McEwen, Characterization of Gait Using Inertial Measurement Units and Neural Networks, International Journal of Exercise Science: Conference Abstract Submissions 2010; Vol. 4, Iss. 1

Slaughter S., Hilbert C., Jouett N.,McEwen M., Quantifying and learning human movement characteristics for fall prevention in the elderly using Inertial Measurement Units and Neural Networks, International Conference of Education, Research, and Innovation, iCERi 2009 Proceedings; ISBN: 978-84-613-2955-7

Other Peer-Reviewed Publications:

J.P. Estrera, W.M. Duncan, S.R. Slaughter, Lineshape analysis for optical transitions in III-V semiconductors using a sequential simplex procedure., Computers in Physics Vol. 6, No. 4, Jul/Aug 1992

Stephen R. Slaughter, "An Application of Artificial Neural Systems in Trend Analysis", (M.S. Thesis, April 1990

Stephen Slaughter, Robert Hartzell, Tai-Chun Chang, A Deep Level Reasoning Tool for Semiconductor Process Simulation., International Semiconductor Manufacturing Science Symposium '89.

Warren K. Gladden, Stephen R. Slaughter, Waiter M. Duncan, Asian Baghdadi, Automatic Determination of the Interstitial Oxygen Content of Silicon Wafers Polished on Both Sides., NIST Special Publication 400-81, November 1988
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